USRC’s Lissa Baseman, Dr. Li Tan, and Olena Tkachenko are at The 47th IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2017) where they are presenting on resilience and machine learning research at USRC.
Lissa Baseman presented in the Industry Track III: Dependability
Data and Security the paper Automating DRAM Fault Mitigation By Learning From Experience (slides). USRC intern, Olena Tkachenko, provided much of the analysis for this work and the paper is in collaboration with AMD and Sandia National Laboratories.
Dr. Tan presented at the RADIANCE (International Workshop on Recent Advances in the DependabIlity AssessmeNt of Complex systEms). His presentation was entitled RSVP: Soft Error Resilient Power Savings at Near-ThresholdVoltage using Register Vulnerability (slides) and was co-authored by other USRC members.